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Laser Diode Bar Test System

For I-L/I-V measurements and wavelength measurements! It automatically measures the LD chip on the bar with simple positioning operations.

We would like to introduce the "Laser Diode Bar Test System" handled by Fukuhara System. With simple positioning operations, it is possible to automatically measure the LD chip on the bar. The display section consists of a 7-segment LED and an LCD, and the operation is interactive through a menu system. For further details, please feel free to contact us. 【The following measurements necessary for the characterization of Laser Diodes (LD) are possible】 (1) I-L/I-V measurement (2) Wavelength measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Light output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.

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